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| 标准编号 | 标准名称 | 发布日期 | 实施日期 | 废止日期 | 替换信息 |
|---|---|---|---|---|---|
| ISO 885:2000 | General purpose bolts and screws -- Metric series -- Radii under the head | ||||
| ISO 15769:2010 | Hydrometry -- Guidelines for the application of acoustic velocity meters using the Doppler and echo correlation methods | ||||
| ISO 18365:2013 | Hydrometry -- Selection, establishment and operation of a gauging station | ||||
| ISO 15798:2001/Cor 1:2003 | |||||
| ISO/TS 24154:2005 | Hydrometry -- Measuring river velocity and discharge with acoustic Doppler profilers | ||||
| ISO 26906:2009 | Hydrometry -- Fishpasses at flow measurement structures | ||||
| ISO 4786:1977 | Enclosed-scale adjustable-range thermometers | ||||
| ISO 13550:2002 | Hydrometric determinations -- Flow measurements in open channels using structures -- Use of vertical underflow gates and radial gates | ||||
| ISO 9335:1995 | Optics and photonics -- Optical transfer function -- Principles and procedures of measurement | ||||
| ISO 4802-1:1988 | Glassware -- Hydrolytic resistance of the interior surfaces of glass containers -- Part 1: Determination by titration method and classification | ||||
| ISO 4802-2:1988 | Glassware -- Hydrolytic resistance of the interior surfaces of glass containers -- Part 2: Determination by flame spectrometry and classification | ||||
| ISO 4802-2:2010 | Glassware -- Hydrolytic resistance of the interior surfaces of glass containers -- Part 2: Determination by flame spectrometry and classification | ||||
| ISO 4802-1:2010 | Glassware -- Hydrolytic resistance of the interior surfaces of glass containers -- Part 1: Determination by titration method and classification | ||||
| ISO 16496:2016 | Laboratory glassware -- Vacuum-jacketed vessels for heat insulation | ||||
| ISO 760:1978 | Determination of water -- Karl Fischer method (General method) | ||||
| ISO 758:1976 | Liquid chemical products for industrial use -- Determination of density at 20 degrees C | ||||
| ISO 6141:2015 | Gas analysis -- Contents of certificates for calibration gas mixtures | ||||
| ISO 6144:2003 | Gas analysis -- Preparation of calibration gas mixtures -- Static volumetric method | ||||
| ISO 2322:1981/Amd 1:1993 | |||||
| ISO 6145-1:2003 | Gas analysis -- Preparation of calibration gas mixtures using dynamic volumetric methods -- Part 1: Methods of calibration | ||||
| ISO 13424:2013 | Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis | ||||
| ISO 6145-4:2004 | Gas analysis -- Preparation of calibration gas mixtures using dynamic volumetric methods -- Part 4: Continuous syringe injection method | ||||
| ISO 6145-5:2001 | Gas analysis -- Preparation of calibration gas mixtures using dynamic volumetric methods -- Part 5: Capillary calibration devices | ||||
| ISO 6145-7:2009 | Gas analysis -- Preparation of calibration gas mixtures using dynamic volumetric methods -- Part 7: Thermal mass-flow controllers | ||||
| ISO 6145-9:2001 | Gas analysis -- Preparation of calibration gas mixtures using dynamic volumetric methods -- Part 9: Saturation method | ||||
| ISO 6712:1982 | Gas analysis -- Sampling and transfer equipment for gases supplying an analytical unit | ||||
| ISO 11039:2012 | Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate | ||||
| ISO 11952:2014 | Surface chemical analysis -- Scanning-probe microscopy -- Determination of geometric quantities using SPM: Calibration of measuring systems | ||||
| ISO 13095:2014 | Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement | ||||
| ISO 14237:2000 | Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of boron atomic concentration in silicon using uniformly doped materials | ||||
| ISO 625:1996/Cor 1:1996 | |||||
| ISO 14606:2015 | Surface chemical analysis -- Sputter depth profiling -- Optimization using layered systems as reference materials | ||||
| ISO 16242:2011 | Surface chemical analysis -- Recording and reporting data in Auger electron spectroscopy (AES) | ||||
| ISO 14701:2011 | Surface chemical analysis -- X-ray photoelectron spectroscopy -- Measurement of silicon oxide thickness | ||||
| ISO 14706:2014 | Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy | ||||
| ISO 14912:2003 | Gas analysis -- Conversion of gas mixture composition data | ||||
| ISO 14976:1998 | Surface chemical analysis -- Data transfer format | ||||
| ISO 16531:2013 | Surface chemical analysis -- Depth profiling -- Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS | ||||
| ISO 17109:2015 | Surface chemical analysis -- Depth profiling -- Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films | ||||
| ISO 11960:2001/Cor 1:2002 | |||||
| ISO 16962:2017 | Surface chemical analysis -- Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry | ||||
| ISO/CD 20579-2 | Surface chemical analysis -- Sample handling, preparation and mounting -- Part 2: Guidelines to preparation and mounting of specimens prior to analysis | ||||
| ISO 16962:2005 | Surface chemical analysis -- Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry | ||||
| ISO 17560:2002 | Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon | ||||
| ISO 17973:2002 | Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis | ||||
| ISO 17974:2002 | Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis | ||||
| ISO 724:1978 | ISO metric screw threads -- Basic dimensions | ||||
| ISO 17862:2013 | Surface chemical analysis -- Secondary ion mass spectrometry -- Linearity of intensity scale in single ion counting time-of-flight mass analysers | ||||
| ISO 18116:2005 | Surface chemical analysis -- Guidelines for preparation and mounting of specimens for analysis | ||||
| ISO 18118:2004 | Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials |
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