（清空日期可显示全部记录）
| 标准编号 | 标准名称 | 发布日期 | 实施日期 | 废止日期 | 替换信息 |
|---|---|---|---|---|---|
| IEC 60086-2:2000 | Primary batteries - Part 2: Physical and electrical specifications | ||||
| IEC 60115-5:1978 | Fixed resistors - Part 5: Sectional specification - Fixed precision resistors: Selection of methods of test and general requirements | ||||
| IEC 60384-3:2006 | Fixed capacitors for use in electronic equipment - Part 3: Sectional specification: Surface mount fixed tantalum electrolytic capacitors with manganese dioxide solid electrolyte | ||||
| IEC 60384-18-1:1993/AMD1:1998 | Amendment 1 - Fixed capacitors for use in electronic equipment - Part 18: Blank detail specification: Fixed aluminium electrolytic chip capacitors with solid electrolyte. Assessment level E | ||||
| IEC 60384-18-1:1993 | Fixed capacitors for use in electronic equipment - Part 18: Blank detail specification: Fixed aluminium electrolytic chip capacitors with solid electrolyte. Assessment level E | ||||
| IEC 60384-20:2008 | Fixed capacitors for use in electronic equipment - Part 20: Sectional specification - Fixed metallized polyphenylene sulfide film dielectric surface mount d.c. capacitors | ||||
| IEC 60539-1:2002 | Directly heated negative temperature coefficient thermistors - Part 1: Generic specification | ||||
| IEC 60738-1:1998 | Thermistors - Directly heated positive step-function temperature coefficient - Part 1: Generic specification | ||||
| IEC 62391-1:2006 | Fixed electric double-layer capacitors for use in electronic equipment - Part 1: Generic specification | ||||
| IEC 60204-1:2005/AMD1:2008 | Amendment 1 - Safety of machinery - Electrical equipment of machines - Part 1: General requirements | ||||
| IEC 60861:1987 | Equipment for continuously monitoring for beta and gamma emitting radionuclides in liquid effluents | ||||
| IEC 60966-3-1:2003 | Radio frequency and coaxial cable assemblies - Part 3-1: Blank detail specification for semi-flexible coaxial cable assemblies | ||||
| IEC 61156-4:2003 | Multicore and symmetrical pair/quad cables for digital communications - Part 4: Riser cables - Sectional specification | ||||
| IEC PAS 62255-1:2001 | Multi-pair cables used in high bit rate digital access telecommunication networks - Part 1: Outdoor cables | ||||
| IEC 60153-2:1974 | Hollow metallic waveguides. Part 2: Relevant specifications for ordinary rectangular waveguides | ||||
| IEC 60154-1:1982 | Flanges for waveguides. Part 1: General requirements | ||||
| IEC 60154-2:1968 | Flanges for waveguides - Part 2: Relevant specifications for flanges for ordinary rectangular waveguides | ||||
| IEC TS 62538:2008 | Categorization of optical devices | ||||
| IEC 60598-2-4:2017 | Luminaires - Part 2-4: Particular requirements - Portable general purpose luminaires | ||||
| IEC 60747-1:1983/AMD2:1993 | Amendment 2 - Semiconductor devices - Discrete devices and integrated circuits - Part 1: General | ||||
| IEC TS 61967-3:2005 | Integrated circuits - Measurement of electromagnetic emissions, 150 KHz to 1 GHz - Part 3: Measurement of radiated emissions - Surface scan method | ||||
| IEC 60191-6:1990/AMD1:1999 | Amendment 1 - Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages | ||||
| IEC 60747-2:2000 | Semiconductor devices - Discrete devices and integrated circuits - Part 2: Rectifier diodes | ||||
| IEC 60747-4:1991+AMD1:1993+AMD2:1999 CSV | Semiconductor devices - Discrete devices - Part 4: Microwave devices | ||||
| IEC 60068-2-42:1982 | Basic environmental testing procedures - Part 2: Tests. Test Kc: Sulphur dioxide test for contacts and connections | ||||
| IEC 60903:1988 | Specification for gloves and mitts of insulating material for live working | ||||
| IEC 60512-1:1994 | Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 1: General | ||||
| IEC TS 62404:2007 | Logic digital integrated circuits - Specification for I/O interface model for integrated circuit (IMIC version 1.3) | ||||
| IEC 60603-1:1981 | Connectors for frequencies below 3 MHz for use with printed boards - Part 1: General rules and guide for the preparation of detail specifications | ||||
| IEC 60264-4-2:1992 | Packaging of winding wires - Part 4: Methods of test - Section 2: Containers made from thermoplastic material for taper barrelled delivery spools | ||||
| IEC 61076-2-101:2008 | Connectors for electronic equipment - Product requirements - Part 2-101: Circular connectors - Detail specification for M12 connectors with screw-locking | ||||
| IEC 61076-3-001:1999 | Connectors for use in d.c., low-frequency analogue and digital high-speed data applications - Part 3-001: Rectangular connectors with assessed quality - Blank detail specification | ||||
| IEC PAS 61076-3-104:2002 | Connectors for electronic equipment - Part 3-104: Detail specification for 8-way, shielded free and fixed connectors, for data transmissions with frequencies up to 600 MHz minimum | ||||
| IEC 62485-1:2015 | Safety requirements for secondary batteries and battery installations - Part 1: General safety information | ||||
| IEC 61334-4-61:1998 | Distribution automation using distribution line carrier systems - Part 4-61: Data communication protocols - Network layer - Connectionless protocol | ||||
| IEC PAS 61076-3-110:2002 | Connectors for electronic equipment - Part 3-110: Detail specification for 8 way connectors for frequencies up to 600 MHz | ||||
| IEC 60122-3:1977/AMD3:1992 | Amendment 3 - Quartz crystal units for frequency control and selection. Part 3: Standard outlines and pin connections | ||||
| IEC 60122-3:1977 | Quartz crystal units for frequency control and selection. Part 3: Standard outlines and pin connections | ||||
| IEC 60862-1:1989 | Surface acoustic wave (SAW) filters. Part 1: General information, standard values and test conditions - Chapter I: General information and standard values - Chapter II: Test conditions | ||||
| IEC 60758:1993 | Synthetic quartz crystal - Specifications and guide to the use | ||||
| IEC 60758:1983 | Synthetic quartz crystal - Chapter I: Specification for synthetic quartz crystal - Chapter II: Guide to the use of synthetic quartz crystal | ||||
| IEC 60679-1:1980/AMD1:1985 | Amendment 1 - Quartz crystal controlled oscillators. Part 1: General information, test conditions and methods | ||||
| IEC 60679-1:1980 | Quartz crystal controlled oscillators. Part 1: General information, test conditions and methods | ||||
| IEC 61837-4:2004 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines | ||||
| IEC 60329:1971 | Strip-wound cut cores of grain oriented silicon-iron alloy, used for electronic and telecommunication equipment | ||||
| IEC 60401-2:2003 | Terms and nomenclature for cores made of magnetically soft ferrites - Part 2: Reference of dimensions | ||||
| IEC 60317-0-2:1997+AMD1:1999+AMD2:2005 CSV | Specifications for particular types of winding wires - Part 0-2: General requirements - Enamelled rectangular copper wire | ||||
| IEC 60317-0-3:1990/AMD1:1992 | Amendment 1 - Specifications for particular types of winding wires. Part 0: General requirements. Section 3: Enamelled round aluminium wire | ||||
| IEC 60317-0-5:1992/AMD2:1999 | Amendment 2 - Specifications for particular types of winding wires - Part 0: General requirements - Section 5: Glass-fibre braided, bare or enamelled rectangular copper wire | ||||
| IEC 60384-14-2:2016 | Fixed capacitors for use in electronic equipment - Part 14-2: Blank detail specification - Fixed capacitors for electromagnetic interference suppression and connection to the supply mains - Safety tests only |
若您对上表中数据有任何疑问，请与网站联系。
