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标准编号 | 标准名称 | 发布日期 | 实施日期 | 废止日期 | 替换信息 |
---|---|---|---|---|---|
IEC 60598-2-18:1993/AMD1:2011 | Amendment 1 - Luminaires - Part 2-18: Particular requirements - Luminaires for swimming pools and similar applications | ||||
IEC 60846-2:2015 | Radiation protection instrumentation - Ambient and/or directional dose equivalent (rate) meters and/or monitors for beta, X and gamma radiation - Part 2: High range beta and photon dose and dose rate portable instruments for emergency radiation protection purposes | ||||
IEC 61025:2006 | Fault tree analysis (FTA) | ||||
IEC 61703:2016 | Mathematical expressions for reliability, availability, maintainability and maintenance support terms | ||||
IEC 62347:2006 | Guidance on system dependability specifications | ||||
IEC 62308:2006 | Equipment reliability - Reliability assessment methods | ||||
IEC 61987-22:2015 | Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 22: Lists of Properties (LOPs) of valve body assemblies for electronic data exchange | ||||
IEC 60404-7:1982 | Magnetic materials. Part 7: Method of measurement of the coercivity of magnetic materials in an open magnetic circuit | ||||
IEC 60534-9:2007/COR1:2008 | Corrigendum 1 - Industrial-process control valves - Part 9: Test procedure for response measurements from step inputs | ||||
IEC 60746-3:2002/COR1:2003 | Corrigendum 1 - Expression of performance of electrochemical analyzers - Part 3: Electrolytic conductivity | ||||
IEC 61158-5-3:2014 | Industrial communication networks - Fieldbus specifications - Part 5-3: Application layer service definition - Type 3 elements | ||||
IEC 60884-2-4:1999 | Plugs and socket-outlets for household and similar purposes - Part 2-4: Particular requirements for plugs and socket-outlets for SELV | ||||
IEC 60052:1935 | Rules for the measurement of test-voltage at power frequencies in dilectric tests by sphere gaps | ||||
IEC 60987:2007+AMD1:2013 CSV | Nuclear power plants - Instrumentation and control important to safety - Hardware design requirements for computer-based systems | ||||
IEC 61156-5:2009+AMD1:2012 CSV | Multicore and symmetrical pair/quad cables for digital communications - Part 5: Symmetrical pair/quad cables withtransmission characteristics up to 1 000 MHz - Horizontal floorwiring - Sectional specification | ||||
IEC 60335-2-45:1986 | Safety of household and similar electrical appliances. Part 2: Particular requirements for portable electric heating tools and similar appliances. | ||||
IEC 60335-2-89:2002/AMD1:2005/COR1:2005 | Corrigendum 1 - Amendment 1 - Household and similar electrical appliances - Safety - Part 2-89: Particular requirements for commercial refrigerating appliances with an incorporated or remote refrigerant condensing unit or compressor | ||||
IEC 61184:1993/AMD1:1996 | Amendment 1 - Bayonet lampholders. | ||||
IEC 60335-2-13:2009+AMD1:2016 CSV | Household and similar electrical appliances - Safety - Part 2-13: Particular requirements for deep fat fryers, frying pans and similarappliances | ||||
IEC 61784-5-12:2010+AMD1:2015 CSV | Industrial communication networks - Profiles - Part 5-12: Installation of fieldbuses - Installation profiles for CPF 12 | ||||
IEC 60745-2-3:1984 | Safety of hand-held motor-operated electric tools. Part 2: Particular requirements for grinders, polishers and disk-type sanders | ||||
IEC 60745-2-12:1982/AMD1:1991 | Amendment 1 - Safety of hand-held motor-operated electric tools. Part 2: Particular requirements for concrete vibrators (internal vibrators) | ||||
IEC 60947-1:1996/AMD1:1997 | Amendment 1 - Low-voltage switchgear and controlgear - Part 1: General rules | ||||
IEC 60947-4-1:2000/COR1:2001 | Corrigendum 1 - Low-voltage switchgear and controlgear - Part 4-1: Contactors and motor-starters - Electromechanical contactors and motor-starters | ||||
IEC TS 61245:1993 | Artificial pollution tests on high-voltage insulators to be used on d.c. systems | ||||
IEC TS 61211:1994 | Insulators of ceramic material or glass for overhead lines with a nominal voltage greater than 1000 V - Puncture testing | ||||
IEC TS 61462:1998 | Composite insulators - Hollow insulators for use in outdoor and indoor electrical equipment - Definitions, test methods, acceptance criteria and design recommendations | ||||
IEC 60099-4:2004+AMD1:2006+AMD2:2009 CSV | Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems | ||||
IEC 60099-4:1991+AMD1:1998+AMD2:2001 CSV | Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems | ||||
IEC 60099-4:1991/AMD2:2001 | Amendment 2 - Surge arresters - Part 4: Metal oxide surge arresters without gaps for a.c. systems | ||||
IEC 60099-4:1991+AMD1:1998 CSV | Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems | ||||
IEC TR 61838:2001 | Nuclear power plants - Instrumentation and control functions important for safety - Use of probabilistic safety assessment for the classification | ||||
IEC 61156-2:1995+AMD1:1999+AMD2:2001 CSV | Multicore and symmetrical pair/quad cables for digital communications - Part 2: Horizontal floor wiring - Sectional specification | ||||
IEC 61156-4:1995+AMD1:1999+AMD2:2001 CSV | Multicore and symmetrical pair/quad cables for digital communications - Part 4: Riser cables - Sectional specification | ||||
IEC 61156-3-1:1995/AMD1:1999 | Amendment 1 - Part 3:Work area wiring. Section 1:Blank detail specification | ||||
IEC 60153-4:1964/AMD2:1971 | Amendment 2 - Hollow metallic waveguides - Part 4: Relevant specifications for circular waveguides | ||||
IEC 60154-2:1980 | Flanges for waveguides. Part 2: Relevant specifications for flanges for ordinary rectangular waveguides | ||||
IEC 60749-3:2002/COR1:2003 | Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination | ||||
IEC 60749-4:2002/COR1:2003 | Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) | ||||
IEC 60749-9:2002/COR1:2003 | Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking | ||||
IEC 60749-6:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature | ||||
IEC 60748-21-1:1991 | Semiconductor devices - Integrated circuits - Part 21; Section One: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedure. | ||||
IEC 60191-1:1966 | Mechanical standardization of semiconductor devices. Part 1: Preparation of drawings of semiconductor devices | ||||
IEC 60512-13-1:1996 | Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 13: Mechanical operating tests - Section 1: Test 13a: Engaging and separating forces | ||||
IEC 60122-1:1962/AMD2:1969 | Amendment 2 - Quartz crystal units for oscillators - Section 1: Standard values and conditions - Section 2: Test conditions | ||||
IEC 60205:1966/AMD2:1981 | Amendment 2 - Calculation of the effective parameters of magnetic piece parts | ||||
IEC PAS 62323:2002 | Dimensions of half pot cores made of magnetic oxides for inductive proximity switches | ||||
IEC 60172:1966 | Test procedure for the evaluation of the thermal endurance of enamelled wire by the lowering of the electric strength between twisted wires | ||||
IEC 60264-4-1:1989 | Packaging of winding wires. Part 4: Methods of test - Section One: Delivery spools made from thermoplastic material | ||||
IEC 60603-1:1991+AMD1:1992 CSV |
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