| 标准编号 | DIN 50441-3 (1985-09) (Withdrawn) |
| 标准名称 | Testing Of Materials For Semiconductor Technology; Measurement Of The Geometric Dimensions Of Semiconductor Slices; Determination Of Flatness Deviation Of Polished Slices By Means Of The Multiple Beam Interference |
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| 发布日期 | 1985-09-01 |
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| 前言 | |
| 无 |
