| 标准编号 | DIN 50448 (1998-01) (Withdrawn) |
| 标准名称 | Testing of materials for semiconductor technology - Contactless determination of the electrical resistivity of semi-insulation semiconductor slices using a capacitive probe |
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| 发布日期 | 1998-01-01 |
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| 前言 | |
| 无 |
