| 标准编号 | DIN 50454-3 (1994-10) (Withdrawn) |
| 标准名称 | Testing Of Materials For Semiconductor Technology - Determination Of The Dislocation Etch Pits Density In Monocrystals Of 3-5-compound Semiconductors - Gallium Phosphide |
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| 发布日期 | 1994-10-01 |
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| 前言 | |
| 无 |
