| 标准编号 | DIN 50431 (1988-05) (Withdrawn) |
| 标准名称 | Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array |
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| 发布日期 | 1988-05-01 |
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| 前言 | |
| 无 |
