| 标准编号 | DIN 50455-1 (2009-10) |
| 标准名称 | Testing Of Materials For Semiconductor Technology - Methods For Characterizing Photoresists - Part 1: Determination Of Coating Thickness With Optical Methods |
| 主编部门 | |
| 标准状态 | |
| 出版社 | |
| 批准文号 | |
| 发布日期 | 2009-10-01 |
| 实施日期 | |
| 废止日期 | |
| 替换信息 | |
| 前言 | |
| 无 |
| 标准编号 | DIN 50455-1 (2009-10) |
| 标准名称 | Testing Of Materials For Semiconductor Technology - Methods For Characterizing Photoresists - Part 1: Determination Of Coating Thickness With Optical Methods |
| 主编部门 | |
| 标准状态 | |
| 出版社 | |
| 批准文号 | |
| 发布日期 | 2009-10-01 |
| 实施日期 | |
| 废止日期 | |
| 替换信息 | |
| 前言 | |
| 无 |
