| 标准编号 | DIN 50443-1 (1988-07) (Withdrawn) |
| 标准名称 | Testing of materials for use in semiconductor technology; detection of crystal defects and inhomogeneities in silicon single crystals by X-ray topography |
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| 发布日期 | 1988-07-01 |
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| 前言 | |
| 无 |
