| 标准编号 | DIN 50454-1 (2000-07) (Withdrawn) |
| 标准名称 | Testing Of Materials For Semiconductor Technology - Determination Of Dislocations In Monocrystals Of 3-5-compound Semi-conductors - Part 1: Gallium Arsenide |
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| 发布日期 | 2000-07-01 |
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| 前言 | |
| 无 |
