| 标准编号 | DIN 50430 (1980-09) (Withdrawn) |
| 标准名称 | Testing Of Semi-conducting Inorganic Materials; Measurement Of The Electrical Resistivity Of Silicon Or Germanium Single Crystals In Bars By Means Of The Two-point Probe Direct Current Method |
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| 发布日期 | 1980-09-01 |
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| 无 |
