| 标准编号 | DIN 50443-2 (1994-06) (Withdrawn) |
| 标准名称 | Testing of materials for semiconductor technology; recognition of defects and inhomogeneities in semiconductor single crystals by X-ray topography; III-V-semiconductor compounds |
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| 发布日期 | 1994-06-01 |
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| 前言 | |
| 无 |
