| 标准编号 | DIN 50441-1 (1996-07) (Withdrawn) |
| 标准名称 | Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 1: Thickness and thickness variation |
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| 发布日期 | 1996-07-01 |
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| 前言 | |
| 无 |
