| 标准编号 | DIN 50434 (1986-02) (Withdrawn) |
| 标准名称 | Testing of materials for semiconductor technology; detection of crystal defects in monocrystalline silicon using etching techniques on {111} and {100} surfaces |
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| 发布日期 | 1986-02-01 |
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| 前言 | |
| 无 |
