| 标准编号 | DIN 50456-2 (1995-04) (Withdrawn) |
| 标准名称 | Characterization of encapsulating compounds for electronic components used in semiconductor technology - Part 2: Determination of ionic impurities using pressure extraction |
| 主编部门 | |
| 标准状态 | |
| 出版社 | |
| 批准文号 | |
| 发布日期 | 1995-04-01 |
| 实施日期 | |
| 废止日期 | |
| 替换信息 | |
| 前言 | |
| 无 |
