| 标准编号 | DIN 50439 (1982-10) (Withdrawn) |
| 标准名称 | Testing Of Materials For Semiconductor Technology; Determination Of Dopant Concentration Profile Of Single Crystalline Semiconductor Material By Means Of The Capacitance Voltage Method And Mercury Contact |
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| 发布日期 | 1982-10-01 |
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| 无 |
