| 标准编号 | DIN 50436 (1976-10) (Withdrawn) |
| 标准名称 | Testing Of Semi-conducting Inorganic Materials; Measurement Of The Metallurgic Thickness Of Epitaxial Layers Of Silicon By The Stacking Fault Method |
| 主编部门 | |
| 标准状态 | |
| 出版社 | |
| 批准文号 | |
| 发布日期 | 1976-10-01 |
| 实施日期 | |
| 废止日期 | |
| 替换信息 | |
| 前言 | |
| 无 |
| 标准编号 | DIN 50436 (1976-10) (Withdrawn) |
| 标准名称 | Testing Of Semi-conducting Inorganic Materials; Measurement Of The Metallurgic Thickness Of Epitaxial Layers Of Silicon By The Stacking Fault Method |
| 主编部门 | |
| 标准状态 | |
| 出版社 | |
| 批准文号 | |
| 发布日期 | 1976-10-01 |
| 实施日期 | |
| 废止日期 | |
| 替换信息 | |
| 前言 | |
| 无 |
