| 标准编号 | DIN 50438-3 (2000-12) (Withdrawn) |
| 标准名称 | Determination ofimpurities in silicon intended for use in semiconductor technology by infrared absorption - Part 3: Determination of boron and phosphorus concentrations |
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| 发布日期 | 2000-12-01 |
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| 前言 | |
| 无 |
