| 标准编号 | SAE J 1752/3 |
| 标准名称 | Measurement of Radiated Emissions From Integrated Circuits-Tem/Wideband Tem (Gtem) Cell Method; Tem Cell (150 Khz to 1 Ghz), Wideband Tem Cell (150 Khz to 8 Ghz) |
| 主编部门 | |
| 标准状态 | |
| 出版社 | |
| 批准文号 | |
| 发布日期 | |
| 实施日期 | |
| 废止日期 | |
| 替换信息 | |
| 前言 | |
| 无 |
| 标准编号 | SAE J 1752/3 |
| 标准名称 | Measurement of Radiated Emissions From Integrated Circuits-Tem/Wideband Tem (Gtem) Cell Method; Tem Cell (150 Khz to 1 Ghz), Wideband Tem Cell (150 Khz to 8 Ghz) |
| 主编部门 | |
| 标准状态 | |
| 出版社 | |
| 批准文号 | |
| 发布日期 | |
| 实施日期 | |
| 废止日期 | |
| 替换信息 | |
| 前言 | |
| 无 |
