| 标准编号 | ASTM F1619-95(2000)e1 (Withdrawn) |
| 标准名称 | Standard Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p -Polarized Radiation Incident at the Brewster Angle |
| 主编部门 | |
| 标准状态 | |
| 出版社 | |
| 批准文号 | |
| 发布日期 | 1995-09-15 |
| 实施日期 | |
| 废止日期 | |
| 替换信息 | |
| 前言 | |
| 无 |
