| 标准编号 | DIN 50446 (1995-09) (Withdrawn) |
| 标准名称 | Testing of materials for semiconductor technology - Determination of defect types and defect densities of silicon epitaxial layers |
| 主编部门 | |
| 标准状态 | |
| 出版社 | |
| 批准文号 | |
| 发布日期 | 1995-09-01 |
| 实施日期 | |
| 废止日期 | |
| 替换信息 | |
| 前言 | |
| 无 |
| 标准编号 | DIN 50446 (1995-09) (Withdrawn) |
| 标准名称 | Testing of materials for semiconductor technology - Determination of defect types and defect densities of silicon epitaxial layers |
| 主编部门 | |
| 标准状态 | |
| 出版社 | |
| 批准文号 | |
| 发布日期 | 1995-09-01 |
| 实施日期 | |
| 废止日期 | |
| 替换信息 | |
| 前言 | |
| 无 |
