| 标准编号 | DIN 50435 (1988-05) (Withdrawn) |
| 标准名称 | Testing of semiconductor materials; determination of the radial resistivity variation of silicon or germanium slices by means of the four-probe/direct current method |
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| 发布日期 | 1988-05-01 |
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| 前言 | |
| 无 |
