| 标准编号 | DIN 50440-1 (1981-11) (Superseded) |
| 标准名称 | Testing Of Materials For Semiconductor Technology; Measurement Of Recombination Carrier Lifetime In Silicon Single Crystals By Means Of Photo Conductive Decay Method; Measurement On Bar Shaped Specimens |
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| 发布日期 | 1981-11-01 |
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| 无 |
