| 标准编号 | DIN 50442-1 (1981-02) (Withdrawn) |
| 标准名称 | Testing Of Semiconductive Inorganic Materials; Determination Of The Surface Structure Of Circular Monocrystalline Semiconductive Slices; As Cut And Lapped Slices |
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| 发布日期 | 1981-02-01 |
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| 前言 | |
| 无 |
