| 标准编号 | DIN 50437 (1979-06) (Withdrawn) |
| 标准名称 | Testing Of Semi-conductive Inorganic Materials; Measuring The Thickness Of Silicon Epitaxial Layer Thickness By Infrared Interference Method |
| 主编部门 | |
| 标准状态 | |
| 出版社 | |
| 批准文号 | |
| 发布日期 | 1979-06-01 |
| 实施日期 | |
| 废止日期 | |
| 替换信息 | |
| 前言 | |
| 无 |
| 标准编号 | DIN 50437 (1979-06) (Withdrawn) |
| 标准名称 | Testing Of Semi-conductive Inorganic Materials; Measuring The Thickness Of Silicon Epitaxial Layer Thickness By Infrared Interference Method |
| 主编部门 | |
| 标准状态 | |
| 出版社 | |
| 批准文号 | |
| 发布日期 | 1979-06-01 |
| 实施日期 | |
| 废止日期 | |
| 替换信息 | |
| 前言 | |
| 无 |
