（清空日期可显示全部记录）
| 标准编号 | 标准名称 | 发布日期 | 实施日期 | 废止日期 | 替换信息 |
|---|---|---|---|---|---|
| I.S. EN ISO 8442-6:2001 | Materials And Articles In Contact With Foodstuffs - Cutlery And Table Holloware - Part 6: Lightly Silver Plated Table Holloware Protected By Lacquer | 2001-07-06 | |||
| DIN EN ISO 8442-7 (2001-03) | Cutlery and table holloware - Part 7: Requirements for table cutlery made of silver, other precious metals and their alloys (ISO 8442-7:2000); English version of DIN EN ISO 8442-7 | 2001-03-01 | |||
| NS EN ISO 8442-7 Ed. 1 (2001) | Materials And Articles In Contact With Foodstuffs - Cutlery And Table Holloware - Part 7: Specification For Table Cutlery Made Of Silver, Other Precious Metals And Their Alloys | ||||
| NBN EN ISO 8442-8:2001 | Materials And Articles In Contact With Foodstuffs - Cutlery And Table Holloware - Part 8: Specification For Silver Table And Decorative Holloware | 2001-06-01 | |||
| ASTM C424-93(2006) (Superseded) | Standard Test Method for Crazing Resistance of Fired Glazed Whitewares by Autoclave Treatment | 2006-02-15 | |||
| NEN EN 13127-8:1998 (Superseded) | Materials And Articles In Contact With Foodstuffs - Cutlery And Table Hollowware - Part 8: Specification For Silver Table And Decorative Hollowware | 1998-02-01 | |||
| DIN 50452-2 (2009-10) | Testing Of Materials For Semiconductor Technology - Test Method For Particle Analysis In Liquids - Part 2: Determination Of Particles By Optical Particle Counters | ||||
| DIN 50452-2 (1991-03) (Superseded) | Particle analysis of liquids for use in semiconductor technology using optical particle counters | 1991-03-01 | |||
| IEC 60119 Ed. 1.0 (Withdrawn) | Recommendations for polycrystalline semiconductor rectifier stacks and equipment | 1960-01-01 | |||
| NF EN 62951-1:2016 | Semiconductor Devices - Flexible And Stretchable Semiconductor Devices - Part 1: Bending Test Method For Conductive Thin Films On Flexible Substrates | ||||
| NF EN 62047-4:2007 (Superseded) | Semiconductor Devices - Micro-electromechanical Devices - Part 4: Generic Specifications For Mems | 2007-07-01 | |||
| KS C IEC 60146-1-3:2002 | Semiconductor convertors-General requirements and line commutated convertors-Part 1-3:Transformers and reactors | 2002-06-18 | |||
| ASTM F1392-00 (Superseded) | Standard Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements With a Mercury Probe | 2000-06-10 | |||
| ASTM F26-87a(1999) (Withdrawn) | Standard Test Methods for Determining the Orientation of a Semiconductive Single Crystal | 1999-01-01 | |||
| ASTM F391-96 (Superseded) | Standard Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage | 1996-01-01 | |||
| ASTM F522-94 (Superseded) | Test Method for Stacking Fault Density of Epitaxial Layers of Silicon by Interference-Contrast Microscopy | 1994-09-01 | |||
| ASTM F847-94(1999) (Superseded) | Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques | 1999-01-01 | |||
| VDE 0701-12:1988 (Superseded) | Repair, Modification And Inspection Of Electrical Appliances; Sauna Heaters And Associated Equipment For Household Use And Similar Purposes | 1988-05-01 | |||
| NS EN ISO 14006:2011 | Environmental Management Systems - Guidelines For Incorporating Ecodesign (Iso 14006:2011) | 2011-10-01 | |||
| NF EN ISO 14015:2010 | Environmental Management - Environmental Assessment Of Sites And Organizations (easo) | 2010-03-01 | |||
| ISO 14031:1999 (Superseded) | Environmental management - Environmental performance evaluation - Guidelines | 1999-11-11 | |||
| ISO 14031:2013 | Environmental management - Environmental performance evaluation - Guidelines | 2013-07-25 | |||
| GOST R ISO 14041:2000 | Environmental Management - Life Cycle Assessment - Goal And Scope Definition And Inventory Analysis | 2001-07-01 | |||
| EN ISO 14044:2006 | Environmental Management - Life Cycle Assessment - Requirements And Guidelines | ||||
| NEN NPR ISO/TR 14047:2012 | Environmental Management - Life Cycle Assessment - Illustrative Examples On How To Apply Iso 14044 To Impact Assessment Situations | 2012-06-01 | |||
| ISO/TR 14049:2000 (Superseded) | Environmental management - Life cycle assessment - Examples of application of ISO 14041 to goal and scope definition and inventory analysis | 2000-03-30 | |||
| SS EN ISO 14051 Ed. 1 (2011) | Environmental Management - Material Flow Cost Accounting - General Framework (Iso 14051:2011) | 2011-09-29 | |||
| NEN EN ISO 14050:2010 | Environmental Management - Vocabulary | 2010-06-01 | |||
| ISO/TS 14048:2002 | Environmental management - Life cycle assessment - Data documentation format | 2002-04-04 | |||
| SR CEN/TR 16388:2012 | Gas-specific Environmental Document - Guideline for Incorporating Within Standards to Minimize the Environmental Impact of gas Infrastructure Across the Whole Life Cycle | 2012-08-20 | |||
| NF EN ISO 19011:2002 (Superseded) | Guidelines For Quality And/or Environmental Management Systems Auditing | 2002-12-01 | |||
| KCMA A161.1:2000 (Superseded) | Performance And Construction Standard For Kitchen And Vanity Cabinets | ||||
| OVE/ONORM EN 60146-1-1:2011 | Semiconductor Converters - General Requirements And Line Commutated Converters - Part 1-1: Specification Of Basic Requirements | 2011-05-01 | |||
| ASTM F1535-00 (Withdrawn) | Standard Test Method for Carrier Recombination Lifetime in Silicon Wafers by Noncontact Measurement of Photoconductivity Decay by Microwave Reflectance | 2000-06-10 | |||
| ASTM F1727-97 (Superseded) | Standard Practice for Detection of Oxidation Induced Defects in Polished Silicon Wafers | 1997-06-10 | |||
| ASTM F1451-92(1999) (Withdrawn) | Standard Test Method for Measuring Sori on Silicon Wafers by Automated Noncontact Scanning | 1999-01-01 | |||
| JIS H 0611:1994 | Methods Of Measurement Of Thickness, Taper And Bow For Silicon Wafers | 1994-01-01 | |||
| 02/714116 DC (Superseded) | Bs 6230:1991 - Installation Of Gas-Fired Forced Convection Air Convection Air Heaters For Commercial And Industrial Space Heating (2Nd And 3Rd Family Gases) | ||||
| SN EN 1:1998 | Flued Oil Stoves With Vaporizing Burners | 1998-11-01 | |||
| DIN EN 12098-4 (2005-12) (Superseded) | Controls for heating systems - Part 4: Optimum start-stop control equipment for electrical systems | 2005-12-01 | |||
| 13/30285587 DC (Superseded) | Bs En 14459 - Safety And Control Devices For Burners And Appliances Burning Gaseous Or Liquid Fuels - Control Functions In Electronic Systems - Methods For Classification And Assessment | 2013-09-09 | |||
| DIN EN 1319 (2010-10) | Domestic gas-fired forced convection air heaters for space heating, with fan-assisted burners not exceeding a net heat input of 70 kW | 2010-10-01 | |||
| UNI EN 1319:2003 (Superseded) | Domestic Gas-fired Forced Convection Air Heaters For Space Heating, With Fan-assisted Burners Not Exceeding A Net Heat Input Of 70 Kw | ||||
| AS 1099.2.10-1989 (Superseded) | Basic environmental testing procedures for electrotechnology - Tests - Test J - Mould growth | ||||
| AS 60068.2.75-2003 | Environmental testing - Tests - Test Eh: Hammer tests | 2003-11-28 | |||
| DR 02484 CP (Superseded) | Environmental testing - Part 2.10: Tests - Test J and guidance: Mould growth | ||||
| DR 02595-02614 CP (Superseded) | Environmental testing | ||||
| DR 03403 CP (Superseded) | Environmental testing - Part 2.45: Tests - Test XA and guidance: Immersion in cleaning solvents | ||||
| AS/NZS 60335.2.58:2015 | Household and similar electrical appliances - Safety - Particular requirements for commercial electric dishwashing machines | 2015-11-30 | |||
| AS/NZS 60335.2.8:2013 (IEC TEXT) | Household and similar electrical appliances - Safety - Particular requirements for shavers, hair clippers and similar appliances | 2013-10-25 |
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